High-End FTIR Applications
Using VERTEX Vacuum Spectrometers

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Step Scan TRS Spectroscopy

VERTEX 80v Provides Highest Accuracy Using Time Resolved Stepwise Data Acquisition.

MIR Photoluminescence (PL)

Amplitude Modulated Step Scan.

Characterization of Ultra-Thin Layers

Highest Sensitivity for Mono-Molecular Layers.

Spectroelectrochemistry with Rapid Scan

Monitoring of Fast Electrochemical Process Without Atmospheric Disturbance.

Further Applications

VERTEX 80v and VERTEX 70v

High-End Research Applications Using VERTEX Series Vacuum Spectrometers.

VerTera THz-Extension for VERTEX 80v

The world's first combined FTIR/cw THz Spectrometer.

UHV FTIR Spectroscopy

VERTEX Vacuum Spectrometers adapted to Customized Ultra-High Vacuum Apparatus.

Step Scan
Time-Resolved Spectroscopy

The step scan technique allows the monitoring of the temporal progress of very fast reproducible events. The interferometer mirror consecutively steps to the separate interferogram points, where the repeatable experiment is restarted again. All VERTEX series spectrometers can obtain superb time resolved data and superior stepping rates which are crucial for experimental feasibility. Thanks to its UltraScan™ interferometer and the full-range of vacuum advantages the VERTEX 80v is widely accepted by the research community achieving unrivaled step-scan performance and most precise scanner control.

Why is vacuum important for step scan technique?

In VERTEX 80 and VERTEX 80v spectrometers, a mechanical positioning accuracy for the scanning mirror of better than 1 nm can be achieved. In such magnitude order already smallest temperature fluctuations of around 0.1 K will cause additional optical path variations of approx. 9 nm. Since in a purged instrument such fluctuations can never be excluded, only vacuum spectrometers can achieve effective accuracies in the low signal digit nm range. By combining the vacuum advantage and the unique UltraScan interferometer, the VERTEX 80v is therefore the only commercial system, achieving an effective positioning accuracy <1nm. Furthermore, it achieves the highest stepping rates of up to 50 steps/s, with a strong impact on complete measurement duration and general feasibility of experiments.

VERTEX 80v matchless step scan performance

  • Highest stepping rate up to 50 steps per second
  • Mechanical and effective positioning accuracy for the scanning mirror better than 1 nm
  • Best performance for time resolved and amplitude/phase modulation spectroscopy
  • Temporal resolution of 6 µsec using 24Bit internal standard ADC
  • Temporal resolution down to the low nsec range with transient recorder board, fast detector and fast preamplifier

Fig. 1: 3D plot of the spectral emission of one laser pulse measured with step-scan TRS.
click to enlarge

There are different operation modes of step scan experiments. Time resolved step scan spectroscopy is used to follow very fast and repeatable reactions or processes e.g., the spectral emission and the pulse duration of a laser as shown in the figure. The stepwise data acquisition resulting in a matrix of interferogram points enable highest spectral resolution and highest temporal resolution at the same time. Amplitude modulated step scan can be used to highlight weak modulated signals from other surrounding signals, as it is applied for photoluminescence measurement in the mid IR region (details see application example MIR PL). Phase modulated step scan is e.g. required for example for depth profiling in photoacoustic spectroscopy.

Read the Product Note M103.
Read the Product Note T28.
Read the Product Note T16.

Further Information

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